Abstract: Recognition of wafer map defect patterns is essential for evaluating the reliability of micro-electronic manufacturing. Due to the difficulty of labeling, the available large-scale wafer ...
Abstract: Numerous trajectory data mining algorithms rely on rich map information for improved effectiveness, necessitating essential trajectory preprocessing steps, such as map matching. Current deep ...
Control of Congress — and the fate of President Donald Trump’s second-term agenda — could come down to a single, urgent decision that landed this week at the Supreme Court’s doorstep. A lower court ...
The final, formatted version of the article will be published soon. Detailed cloud information over the Earth's sunlit hemisphere is an important EPIC-image biproduct stemming from reflected solar ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback