IEEE

Efficient Circuit Performance Prediction Using Machine Learning: From Schematic to Layout and Silicon Measurement with Minimal Data Input

Abstract: We present an ML-driven framework for predicting circuit performance metrics, bridging the gap between schematic and layout simulations, multi-process corner analysis, and measured silicon ...
IEEE

Robust Open-Circuit Fault Diagnosis for PMSM Drives Using Wavelet Convolutional Neural Network With Small Samples of Normalized Current Vector Trajectory Graph

Abstract: Open-circuit fault is one of the most common faults in permanent-magnet synchronous machine (PMSM) drives. The open-circuit fault can cause the obvious change of stator currents of the PMSM.