Abstract: Recognition of wafer map defect patterns is essential for evaluating the reliability of micro-electronic manufacturing. Due to the difficulty of labeling, the available large-scale wafer ...
The Wisconsin Supreme Court ordered a pair of three-judge panels to oversee lawsuits seeking a redraw of the battleground ...
The thunder of a rifle echoes across the Savannah. Antelope scatter as birds of all feathers take to the air. A dull thud ...
2025 Guidance -- First quarter GMV forecasted at $90 million to $96 million (down 2% to up 5%), net revenue at $21.7 million ...
Abstract: In urban scenes, there are man-made ground objects with complex structures and significant height differences, which leads to challenges in generating large-scale true digital orthophoto ...
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